kqcircuits.test_structures.stripes_test_increasing_width

class kqcircuits.test_structures.stripes_test_increasing_width.StripesTestIncreasingWidth[source]

Bases: kqcircuits.test_structures.test_structure.TestStructure

PCell declaration for optical lithography test stripes.

Contains a given number of lines in base_metal_gap_wo_grid-layer with given length and spacing, and increasing width. There is also a text in base_metal_gap_wo_grid-layer next to the lines, which shows the line width.

build()[source]

Child classes re-define this method to build the PCell.

PCell parameters:

  • num_stripes (Int) - Number of stripes, default=20

  • min_stripe_width (Double) - Beginning width of the stripe sequence, default=1, unit=μm

  • stripe_step (Double) - Stripe widening increment in the stripe sequence, default=1, unit=μm

  • stripe_length (Double) - Length of the stripes, default=100, unit=μm

  • stripe_spacing (Double) - Spacing between the stripes, default=1, unit=μm

../_images/kqcircuits.test_structures.stripes_test_increasing_width.png