kqcircuits.test_structures.tsv_test_pattern¶
- class kqcircuits.test_structures.tsv_test_pattern.TsvTestPattern[source]¶
Bases:
kqcircuits.test_structures.test_structure.TestStructure
PCell declaration for TSV test structures which resembles a TSV fencing for a CPW transmission line.
Contains a given number of TSVs in through silicon via-layer with given vertical, horizontal pitch, placeholder for CPW, diameter and the lateral profile of the TSV.
cpw_distance (Double) - CPW Placeholder distance, default=
100
, unit=μm
hor_distance (Double) - Horizontal pitch on TSV, default=
200
, unit=μm
ver_distance (Double) - Vertical pitch on TSV, default=
500
, unit=μm
tsv_array_form (List) - TSV test layout, default=
[2, 6, 6, 2, 6, 6, 2]
a (Double) - Width of center conductor, default=
10
, unit=μm
b (Double) - Width of gap, default=
6
, unit=μm
n (Int) - Number of points on turns, default=
64
r (Double) - Turn radius, default=
100
, unit=μm
margin (Double) - Margin of the protection layer, default=
5
, unit=μm
face_ids (List) - Chip face IDs list, default=
['1t1', '2b1', '1b1', '2t1']
display_name (String) - Name displayed in GUI (empty for default), default=
protect_opposite_face (Boolean) - Add opposite face protection too, default=
False
tsv_type (String) - TSV type, default=
Tsv Standard
, choices=['Tsv Standard', 'Tsv Ellipse']
tsv_diameter (Double) - TSV diameter, default=
10
, unit=μm
tsv_elliptical_width (Double) - TSV elliptical width, default=
30
, unit=μm
